Thickness-Dependent Nonlinear Electrical Conductivity of Few-Layer Muscovite Mica
نویسندگان
چکیده
We report on the direct current (dc) current-voltage ($I$-$V$) characteristics of few-layer muscovite mica (MuM) flakes exfoliated and transferred onto $\mathrm{Si}\mathrm{O}$${}_{2}$/$\mathrm{Si}$ substrate, under different substrate dc bias voltages. Contrary to usual observations in conventional two-dimensional systems, we observe an increase in-plane electrical conductivity with a reducing thickness MuM flakes. At given voltage, approximately five-layered flake (${T}_{3}$) is 3 orders magnitude larger than that ten-layered (${T}_{2}$). The $I$-$V$ are used analyze mechanism conduction. model-based analysis reveals hopping-conduction be dominant as compared Poole-Frenkel effect. thickness-dependent work function measured using Kelvin probe force microscopy for $\mathrm{Si}$ substrate. Assuming correlated Fermi level, upward movement toward conduction band flakes, indicating conduction-band carrier density. observed ${T}_{3}$ when ${T}_{2}$ may attributed surface doping due increased contribution from ${\mathrm{K}}^{+}$ ions lattice relaxation. Our results show there possibility wide-band-gap semiconductor it can open up avenues electronic devices.
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ژورنال
عنوان ژورنال: Physical review applied
سال: 2022
ISSN: ['2331-7043', '2331-7019']
DOI: https://doi.org/10.1103/physrevapplied.17.064042